Multi-mode CT offline inspection system is a high-performance X-ray imaging device supporting planar and cone-beam CT. It can adopt an advanced field-emission cold cathode electron source for instantaneous electron emission and high-speed modulation.
Widely applied in material science, electronic packaging, precision machinery, semiconductor manufacturing, aerospace and failure analysis, it delivers high-precision, multi-angle composite imaging. With micron-level resolution, it visualizes fine internal structures and micro defects of materials.
The system offers reliable imaging solutions for electronic equipment quality control, R&D verification and failure analysis, enabling improved product reliability and manufacturing quality.