The multi-mode CT offline inspection system is a high-performance X-ray imaging device for industrial NDT and precision measurement, supporting planar CT and cone-beam CT. It can be configured with an advanced field-emission cold cathode electron source to achieve instantaneous electron emission and fast modulation.
Widely applied in materials science, electronic packaging, precision machinery, semiconductor manufacturing and aerospace for failure analysis, it adopts high-precision multi-angle composite imaging. With micron-level resolution, it reveals internal fine structures and clearly visualizes material internal features and micro defects.
It provides reliable imaging solutions for industrial quality control, R&D verification and failure analysis, improving product reliability and manufacturing quality.