Near-Wall Probe Series
● Distance from the edge of both the first and last wafers to the outer edge of the housing is 1 mm.

● Performance Characteristics:
1. Acoustically matched with Rexolite.
2. Small blind zones at both ends.
3. Ideal for detecting delamination, debonding, and porosity of composite materials when combined with an encoder for C-scan imaging.
Product Parameters



近壁探头-参数系列.png


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