Robust P1
ROBUST P1 Series PA ultrasonic boards feature superior performance and high reliability, serving as an ideal platform for automated testing. Widely used in manufacturing, aerospace, transportation and new energy industries, they efficiently deliver accurate inspection solutions and accelerate the development of automated inspection technology. The series also provides reliable technical support and innovative solutions to optimize inspection workflows and elevate quality control, boosting industrial advancement.
Product Advantages
Rich optional configurations
● Optional models: 32/64PR, 32/128PR, 16/128PR, 16/64PR
● Multiple display modes including A/B/S/C/3D and combined displays, with full-data encoder recording
Supports secondary development
● Equipped with extended software and hardware interfaces, supporting secondary development.
● Suitable for various automated phased array ultrasonic testing system platforms.
Supports 2D/3D TFM technology
● Supports 3D and 2D TFM techniques, with a maximum imaging resolution of up to 2048×2048, delivering clear imaging and greatly improving the detectability of small defects.
● 3D real-time process simulation.
● Diverse gate types for easy elimination of interference signals.
Intelligent Defect Analysis
● Customizable intelligent defect analysis module, supporting automatic detection and analysis of various defect types including weld defects, pipeline corrosion, and delamination defects in composite plates.
● Supports nozzle fillet weld inspection with real-time update of weld cross-section views.
Testing Cases
Product Parameters

 Robust P1

 Phased Array Channels

 Standard Channels (Optional)

 Configuration

 Receive/Transmit

 32/128

 2/2

 Sound Speed

 340–15,240 m/s

 340–15,240 m/s

 Pulse generator

 Inspection mode

 PE/PC

 PE/PC/TT/TOFD

 Pulse voltage

 20–100 V/10 V

 100 V/200 V/400 V

 Pulse mode

 Negative square wave

 Negative square wave

 Pulse width

 25–1000 ns / 2.5 ns

 25–1000 ns / 2.5 ns

 Pulse rise time

 <8 ns

 <8 ns

 PRF

 40 kHz

 24 kHz

 Delay

 20 μs/2.5 ns

 20 μs/2.5 ns

 Receiver

 Gain Range

 0–120 dB

 0–120 dB

 Bandwidth

 0.9–20 MHz

 0.5–20 MHz

 Receive delay

 20 μs / 2.5 ns

 20 μs/2.5 ns

 Data acquisition

 Sampling rate

 100 MHz

 100 MHz

 ADC resolution

 10-bit

 12-bit

 Number of focusing rules

 512

 N/A

 Focusing Type

 Real depth/Half-wave/Projection/Arbitrary surface

 NA

 Detection

 FW/HW+/HW-/RF

 FW/HW+/HW-/RF

 Synchronization

 Start pulse or gate

 Start pulse or gate

 Maximum Fluctuation

 200%

 200%

 Scanning and Display

 Scan Type

 TFM/Sector/Linear/Compound

 NA

 Display Modes

 A/B/S/C/3D/FMC-TFM/PWI-TFM/FMC-PCI/PWI-PCI/Top C/Strip Chart

 A/B/C/Strip Chart

 Measurement Units

 mm/inch

mm/inch

 Adaptive filtering

 Available

 NA

 Bandpass filter

 Full-time data averaging

 NA

 DAC

 Number of points

 16

 16

 TCG

 Number of points

 16

 16

 Maximum Gain

 40 dB

 40 dB

 Maximum gain slope

 40 dB/μs

 40 dB/μs

 Gate

 Gate

 A/B/C/I + Custom Gate

 Number of gates

 Unlimited

 Gate Threshold

 0–100%

 Gate Trigger Mode

 Peak/Rise

 Full Focus

 Maximum Points

 4096×1024

 Full-Focus Aperture

 128 emitters

 Full-focus mode

 TT, TTT, TTTT, TTTTT, LL, LLL, LLLL, LLLLL, TLT, TLL, LTT

 Test Report

 Word, PDF, Excel

 Ethernet

 1000 Mb/s

 Encoder

 LEMO 16-Pin

 Language

 Chinese/English/Russian/French/German/Italian

 Power

 DC

 15 V DC

 Ambient Temperature

 Operating Temperature

 -10 to 45°C

 Storage Temperature

 -40 to 60°C

 Relative Humidity

 20%–90% RH (at +40°C)

 Physical Specifications

 Dimensions

 350 mm × 245 mm × 55 mm

 Weight

 3.4 kg

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