- Guangzhou Doppler | PAUT Detector | Ultrasonic Probe | SAM | Automated Testing System | CT Inspection System

Building on the Robust P1, the Robust P2 board features a fully optimized hardware architecture. It adopts an advanced design with 128‑channel parallel transmit and 64‑channel receive, supporting up to 128‑element phased array probes, which significantly improves the parallel computing capability for data acquisition and processing.
The board integrates three inspection modes: UT (Ultrasonic Testing), PA (Phased Array), and TFM (Total Focusing Method), enabling it to flexibly meet complex non‑destructive testing requirements across various industrial sectors, including aerospace, energy and power, and rail transit.

Product Advantages

Software Development Kit (SDK)

Supports full coverage of 2D scanning, PA, UT, TFM (FMC/PWI/3D compatible), PCI (FMC/PWI), and TOFD, accelerating system integration and deployment.

Improve quality control and production efficiency

By optimizing inspection processes, potential issues can be identified early, reducing production costs, improving product yield and enhancing industrial competitiveness.

Flexibly cope with complex inspection tasks

The ROBUST series supports free switching between TFM and phased array functions, and provides simultaneous detection with two independent TOFD channels (P1 optional) and phased array channels. This greatly improves detection efficiency and accuracy, adapting to a wide range of complex inspection tasks. Whether for mass production or the highly demanding aerospace industry, the ROBUST series delivers robust technical support.

Customized Solutions for Advancing Industry Development

Powered by innovative technology and robust functions, the ROBUST series delivers flexible customized inspection solutions for multiple industries, enabling high-quality data acquisition in complex scenarios and advancing automated inspection technology.

Testing Cases

Intelligent Defect Analysis for Precise Quality Control

64-channel parallel scanning, breaking through inspection speed bottlenecks

Supports DLA/DMA probes

Product Parameters

Robust P2		Phase-array control channels		Standard Channels
Configuration	Receive/Transmit	64/128		2/2
	Sound Speed	340–15,240 m/s		340–15,240 m/s
Pulse generator	Inspection mode	PE/PC		PE/PC/TT/TOFD
	Pulse voltage	20–120 V/10 V		100 V/200 V/400 V
	Pulse mode	Bipolar square wave		Negative square wave
	Pulse width	20–1250 ns / 2.5 ns		25–1000 ns/2.5 ns
	Pulse rise time	<10 ns		<10 ns
	PRF	40 kHz		24 kHz
	Delay	20 μs/2.5 ns		20 μs/2.5 ns
Data Acquisition	Sampling rate	200 MHz		200 MHz
	ADC resolution	16-bit		16-bit
	Focusing Type	True Depth / Half-Path / Projection / Arbitrary Plane / Dynamic Focus		NA
	Number of Focusing Rules	1024		NA
	Detection	FW/HW+/HW-/RF		FW/HW+/HW-/RF
	Maximum Fluctuation	800%		800%
Receiver	Gain Range	0–120 dB		0–120 dB
	Bandwidth	0.3–25 MHz		0.3–25 MHz
	Receive delay	20 μs / 2.5 ns		20 μs/2.5 ns
Scanning and Display	Scan Type	Full-focus/Linear/Sector/Compound		NA
	Display Modes	A/B/C/S/3D/FMC-TFM/PWI-TFM/FMC-PCI/PWI-PCI/TopC/Strip Chart		A/B/C/Strip Chart
	Measurement Units	mm/inch
TCG	Number of points	16
	Maximum gain	40 dB
	Maximum gain slope	40 dB/10 ns	40 dB/μs
Gate	Gates	A/B/C/I + Custom Gate
	Number of gates	Unlimited
	Gate Threshold	0–100%
Full Focus	Resolution	1024×1024
Test Report		Word, PDF, Excel
Interface	Ethernet	1000 Mb/s
	Encoder	Dual-axis, LEMO 16-pin
Language		Chinese/English/Russian/French/German/Italian
Power Supply	DC supply voltage	15 V DC
Physical Specifications	Dimensions	368.9 mm × 250.6 mm × 90.1 mm
	Weight	5 kg

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