● Dual-ray source and dual-detector design with freely switchable micro-focus
● High-energy penetration: X-ray source voltage optional at 225KV/450KV, adapting to the thickness and density of various metal materials, castings and forgings
|
Item |
Parameter |
|
X-ray source focus |
225KV:7μm 450KV:63μm |
|
Detector pixels |
Flat panel detector: 3072*3072 Linear array detector: 12 pixels/mm |
|
Resolution (JIMA card test) |
≤7μm ≤40μm |
|
Pixel size |
139 μm (Flat panel detector) |
|
Range |
Diameter × Height: 280mm × 400mm (single scan) Maximum imaging size with expanded field of view: Diameter × Height 400mm * 600mm |
|
Exercise schedule |
The sample stage can move in both the X and Y directions and rotate around the Z-axis, with a Y-axis travel ≥1600mm. The X-ray source can move along the Z-axis, with a Z-axis travel ≥800mm. The detector can move in three directions (X, Y, and Z), with an adjustable focal length (FDD) ≥1600mm and a Z-axis travel ≥800mm. |
|
Sample stage load-bearing capacity |
100kg |
|
Radiation leakage rate |
≤2.0μSV/h |
|
Equipment dimensions (length*width*height) |
5600*2700*3140(mm) |
|
Equipment weight |
40000 Kg |