Robust F1
ROBUST F1 adopts a high-speed processing chip, delivering stable, reliable high-speed operation with lower power consumption and higher energy efficiency.
Its multi-channel design maximizes the strengths of array and dual-array probes, broadening the application of phased array technology.
Widely applied in nuclear power, aerospace, high-speed railway, electric power and shipbuilding, it satisfies high-precision and high-resolution NDT requirements.
It excels in challenging scenarios including austenitic stainless steel welds, dissimilar metal welds and thick-walled high-attenuation components.
Two models (128/128PR and 256/256PR) are available to meet diverse application needs.
Product Advantages
● Supports phased array multi-beam parallel inspection to significantly boost linear scan imaging efficiency.
● Enables 3D TFM inspection with real-time visual imaging.
● Delivers higher resolution via 2D FMC-TFM and PWI-TFM, with up to 4 million data points per frame.
● Supports simultaneous PA and TFM inspection. A single unit adapts to diverse testing scenarios, enabling more accurate analysis via cross-mode comparison.
● Dual linear/dual array probes deliver higher signal-to-noise ratio and superior performance over conventional linear array probes in complex inspection conditions.
● New bipolar pulse generator boosts energy for thick-wall penetration and improves defect detection rate.
● Max pulse repetition frequency reaches 40 kHz, ideal for high-speed automated inspection.
● Supports high-speed high-precision multi-channel data acquisition and real-time ultrasonic signal processing, with data compatible for C-scan and S-scan imaging.
● Optional UT channels enable PA-UT and PA-TOFD combined inspection.
Testing Cases
Product Parameters

 Robust F1

 Phased Array Channels

 Configuration

 Receive/Transmit

 256/256, 128/128, 64/64

 Sound Speed

 340–15,240 m/s

 Pulse Generator

 Detection Mode

 PE/PC

 Pulse voltage

 40 V / 70 V / 100 V / 130 V / 150 V / 200 V

 Pulse Type

 Bipolar square wave

 Pulse width

 20–1000 ns / 2.5 ns

 Pulse rise time

 <8 ns

 PRF

40 kHz

 Delay

 20 μs/2.5 ns

 Receiver

 Gain range

 0–120 dB

 Bandwidth

 0.4–25 MHz

 Receive delay

 20 μs / 2.5 ns

 Data Acquisition

 Sampling Rate

 200 MHz

 ADC resolution

 16-bit

 Number of Focusing Rules

 1024

 Focusing modes

 True depth / Half-path / Projection / Arbitrary surface

 Detection

 FW/HW+/HW-/RF

 Synchronization

 Leading Edge or Gated

 Maximum Peak

 800%

 Scanning and Display

 Scan Type

 Linear/Sector/Compound/Full Focus

 Display Modes

 A/B/S/C/TFM/3D/TopC/Strip Chart

 Measurement Units

 mm/inch

 Adaptive filtering

 Yes

 Bandpass filter

 Full-time data averaging

 DAC

 Number of points

 16

 TCG

 Number of points

 16

 Maximum gain

 40 dB

 Gate

 Gate

 A/B/C/I + Custom Gate

 Number of gates

 Unlimited

 Gate Threshold

 0–100%

 Gate Trigger Mode

 Peak/Rise

 Test Report

 WORD, PDF, EXCEL

 I/O Interface

 Ethernet

 1000 Mb/s, 10 Gb/s

 Encoder

 Dual-axis, LEMO 16-pin

 Languages

 Chinese/English/Russian/French/German/Italian

 Power

 15 V DC

 Ambient temperature

 Operating Temperature

 -10 to 45°C

 Storage Temperature

 -40 to 60°C

 Relative Humidity

 20%–90% RH (at +40°C)

 Physical Specifications

 Dimensions

 390.03 mm × 243 mm × 227 mm (256/256),

 388.53 mm × 243 mm × 137 mm (128/128),

 266 mm × 216 mm × 65 mm (64/64)

 Weight

12.2 kg (256/256)

 7 kg (128/128)

 4 kg (64/64)

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